图书介绍

Advances in Imaging and Electron Physics Volume 1362025|PDF|Epub|mobi|kindle电子书版本百度云盘下载

Advances in Imaging and Electron Physics Volume 136
  • edited by Peter W. Hawkes 著
  • 出版社： Academic Press
  • ISBN：0120147785
  • 出版时间：2005
  • 标注页数：333页
  • 文件大小：55MB
  • 文件页数：349页
  • 主题词：

PDF下载


点此进入-本书在线PDF格式电子书下载【推荐-云解压-方便快捷】直接下载PDF格式图书。移动端-PC端通用
种子下载[BT下载速度快]温馨提示：（请使用BT下载软件FDM进行下载）软件下载地址页直链下载[便捷但速度慢]  [在线试读本书]   [在线获取解压码]
点击复制MD5值：851557d96799d2d01d1f2149a6be7236

下载说明

Advances in Imaging and Electron Physics Volume 136PDF格式电子书版下载

下载的文件为RAR压缩包。需要使用解压软件进行解压得到PDF格式图书。

点击复制85GB完整离线版磁力链接到迅雷FDM等BT下载工具进行下载  详情点击-查看共享计划
建议使用BT下载工具Free Download Manager进行下载,简称FDM(免费,没有广告,支持多平台）。本站资源全部打包为BT种子。所以需要使用专业的BT下载软件进行下载。如BitComet qBittorrent uTorrent等BT下载工具。迅雷目前由于本站不是热门资源。不推荐使用！后期资源热门了。安装了迅雷也可以迅雷进行下载！

（文件页数 要大于 标注页数，上中下等多册电子书除外）

注意：本站所有压缩包均有解压码： 点击下载压缩包解压工具

图书目录

Real and Complex PDE-Based Schemes for Image Sharpening and Enhancement&GUY GILBOA，NIR SOCHEN，AND YEHOSHUA Y.ZEEVI3

Ⅰ.Overview of PDE-Based Processes3

Ⅱ.Sharpening by the Axiomatic Approach21

Ⅲ.Sharpening by the Variational Approach46

Ⅳ.Complex Diffusion Processes61

Ⅴ.Texture-Preserving Denoising87

Ⅵ.Conclusion103

References104

The S-State Model for Electron Channeling in High-Resolution Electron Microscopy&P.GEUENS AND D.VAN DYCK113

Ⅰ.Introduction113

Ⅱ.The Channeling Theory124

Ⅲ.Calculation of the Eigenfunctions of an Electron in an Isolated Atom Column130

Ⅳ.The S-State Model160

Ⅴ.The S-State Model for Nonisolated Atom Columns175

Ⅵ.The S-State Model in Case of Crystal or Beam Tilt191

Ⅶ.Experimental Channeling Maps201

Ⅷ.Electron Diffraction and the S-State Model203

References223

Measurement of Electric Fields on Object Surface in an Emission Electron Microscope&S.A.NEPIJKO，N.N.SEDOV，AND G.SCHONHENSE228

Ⅰ.Introduction228

Ⅱ.Direct and Inverse Problems of Measurement of Electric Fields（Potential）on the Object Surface in Emission Electron Microscope230

Ⅲ.Model Experiments on Mapping of Electric Fields （Potential）on the Object Surface Using an Emission Electron Microscope252

Ⅳ.The Effect of the Local Fields and Microroughness at the Object on the Imaging and Resolving Power of an Emission Electron Microscope262

Ⅴ.Practical Applications of Microfield Measurement Using an Emission Electron Microscope278

Ⅵ.Measurement of Object Surface Geometry（Relief）with an Emission Electron Microscope291

Ⅶ.Conclusions312

References313

Index317

热门推荐